The ideal goal in electronic manufacturing is to do everything right in the first place. If we succeeded, we could eliminate testing. What is the point of testing something that we know is right? It is a waste of time that does not add value and could also lead to uncertainty and loss of productivity […]


The “Boundary-Scan” testing system, also known as “JTAG” , is a testing technique in electronic systems for integrated circuits or chips (microprocessors, microcontrollers, memories, chipsets,etc.) To do this, they must be compatible with this system in order to be able to verify their electrical interconnects which, due to their encapsulated format, are not physically accessible […]