Many years have passed since the first failure modes and effects analysis tools were developed in the mid-20th century. FMEA (the acronym for Failure Modes and Effects Analysis) was initially used in the military and aerospace sectors. In the 1970s, Ford adopted the method, which pushed it into the automotive sector. It wasn’t until the 1990s […]

The ideal goal in electronic manufacturing is to do everything right in the first place. If we succeeded, we could eliminate testing. What is the point of testing something that we know is right? It is a waste of time that does not add value and could also lead to uncertainty and loss of productivity […]

The “Boundary-Scan” testing system, also known as “JTAG” , is a testing technique in electronic systems for integrated circuits or chips (microprocessors, microcontrollers, memories, chipsets,etc.) To do this, they must be compatible with this system in order to be able to verify their electrical interconnects which, due to their encapsulated format, are not physically accessible […]